Enhancing Manufacturing and R&D using cross-section and polishing. Optical Light Microscopy (OLM), Scanning Electron Microscopy (SEM), Electron Dispersive Spectrometry (EDS), Atomic Force Microscopy (AFM), Scanning Profilometry, and custom Metrology solutions.

Factory trained scientists employ many years of experience in the fields of SEM/EDS, AFM, profilometry, metrology, spectrometry, engineering and more project pricing for repeat investigation of process. Material matching, and imaging easy.
Location in the cost-effective central valley of California. We can help you solve prblems or create marketing materials. We have the knowledge.

Woodbridge Microscopy LLC
Michael Groom - Sr. Characterization Scientist

Modesto Microscopes
Gary Williams - Sr. Characterization Scientist